The main objective of the NanoXCT project is the design, development and implementation of a compact X-ray computed tomography system for nondestructive chemical and structural characterization of nano-materials and components. The targeted system will avoid expensive X-ray optical elements and not rely on a synchrotron source, which would both extend the costs and would constrain the application areas of the aimed at NanoXCT device. 


In detail the following goals will be realized: